Tap|talk
AI & Machine Learning: How It Impacts QA with Geoff Meyer from Dell
- Autor: Vários
- Narrador: Vários
- Editor: Podcast
- Duración: 0:38:13
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Sinopsis
Geoff Meyer, Test Architect and QA Thought Leader from Dell EMC joins tap|TALK to discuss Artificial Intelligence and Machine Learning, and how it is impacting QA and Test Automation, as well as Software Development as a whole. Geoff spoke on these topics as the Keynote Address at STAREAST 2018, and shares some great info on this edition of tap|TALK. This is a great episode for QA Practitioners and Technology Leaders alike!
